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369,29 €
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
276,97
369,29 €
  • Išsiųsime per 12–18 d.d.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the p…
  • Leidėjas:
  • Metai: 2010
  • Puslapiai: 204
  • ISBN-10: 3642057691
  • ISBN-13: 9783642057694
  • Formatas: 15.6 x 23.4 x 1.2 cm, minkšti viršeliai
  • Kalba: Anglų
  • Extra -25 % nuolaida šiai knygai su kodu: ENG25

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (el. knyga) (skaityta knyga) | knygos.lt

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This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

EXTRA 25 % nuolaida su kodu: ENG25

276,97
369,29 €
Išsiųsime per 12–18 d.d.

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  • Autorius: Martin Schmidbauer
  • Leidėjas:
  • Metai: 2010
  • Puslapiai: 204
  • ISBN-10: 3642057691
  • ISBN-13: 9783642057694
  • Formatas: 15.6 x 23.4 x 1.2 cm, minkšti viršeliai
  • Kalba: Anglų

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

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