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Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry
Knygos.lt klubas Knygos.lt nariams
198,30 €
-30%
Įprastai
283,29 €
  • Išsiųsime per 12–18 d.d.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion…
  • Leidėjas:
  • ISBN-10: 1118480481
  • ISBN-13: 9781118480489
  • Formatas: 15.8 x 23.6 x 2.3 cm, kieti viršeliai
  • Kalba: Anglų

Secondary Ion Mass Spectrometry (el. knyga) (skaityta knyga) | knygos.lt

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Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
- Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
- Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
- Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
- Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
- Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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  • Autorius: Paul Van Der Heide
  • Leidėjas:
  • ISBN-10: 1118480481
  • ISBN-13: 9781118480489
  • Formatas: 15.8 x 23.6 x 2.3 cm, kieti viršeliai
  • Kalba: Anglų

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
- Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
- Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
- Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
- Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
- Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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