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Memory Dump Analysis Anthology, Volume 6
Memory Dump Analysis Anthology, Volume 6
Knygos.lt klubas Knygos.lt nariams
47,24 €
-30%
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67,49 €
  • Išsiųsime per 12–18 d.d.
Contains revised, edited, cross-referenced, and thematically organized selected DumpAnalysis.org blog posts about memory dump and software trace analysis, software troubleshooting and debugging written in November 2010 - October 2011 for software engineers developing and maintaining products on Windows platforms, quality assurance engineers testing software on Windows platforms, technical support and escalation engineers dealing with complex software issues, and security researchers, malware an…
  • Leidėjas:
  • Metai: 2013
  • Puslapiai: 306
  • ISBN-10: 1908043199
  • ISBN-13: 9781908043191
  • Formatas: 15.2 x 22.9 x 1.8 cm, minkšti viršeliai
  • Kalba: Anglų

Memory Dump Analysis Anthology, Volume 6 (el. knyga) (skaityta knyga) | knygos.lt

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Contains revised, edited, cross-referenced, and thematically organized selected DumpAnalysis.org blog posts about memory dump and software trace analysis, software troubleshooting and debugging written in November 2010 - October 2011 for software engineers developing and maintaining products on Windows platforms, quality assurance engineers testing software on Windows platforms, technical support and escalation engineers dealing with complex software issues, and security researchers, malware analysts and reverse engineers. The sixth volume features: - 56 new crash dump analysis patterns including 14 new .NET memory dump analysis patterns - 4 new pattern interaction case studies - 11 new trace analysis patterns - New Debugware pattern - Introduction to UI problem analysis patterns - Introduction to intelligence analysis patterns - Introduction to unified debugging pattern language - Introduction to generative debugging, metadefect template library and DNA of software behavior - The new school of debugging - .NET memory dump analysis checklist - Software trace analysis checklist - Introduction to close and deconstructive readings of a software trace - Memory dump analysis compass - Computical and Stack Trace Art - The abductive reasoning of Philip Marlowe - Orbifold memory space and cloud computing - Memory worldview - Interpretation of cyberspace - Relationship of memory dumps to religion - Fully cross-referenced with Volume 1, Volume 2, Volume 3, Volume 4, and Volume 5

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  • Autorius: Dmitry Vostokov
  • Leidėjas:
  • Metai: 2013
  • Puslapiai: 306
  • ISBN-10: 1908043199
  • ISBN-13: 9781908043191
  • Formatas: 15.2 x 22.9 x 1.8 cm, minkšti viršeliai
  • Kalba: Anglų

Contains revised, edited, cross-referenced, and thematically organized selected DumpAnalysis.org blog posts about memory dump and software trace analysis, software troubleshooting and debugging written in November 2010 - October 2011 for software engineers developing and maintaining products on Windows platforms, quality assurance engineers testing software on Windows platforms, technical support and escalation engineers dealing with complex software issues, and security researchers, malware analysts and reverse engineers. The sixth volume features: - 56 new crash dump analysis patterns including 14 new .NET memory dump analysis patterns - 4 new pattern interaction case studies - 11 new trace analysis patterns - New Debugware pattern - Introduction to UI problem analysis patterns - Introduction to intelligence analysis patterns - Introduction to unified debugging pattern language - Introduction to generative debugging, metadefect template library and DNA of software behavior - The new school of debugging - .NET memory dump analysis checklist - Software trace analysis checklist - Introduction to close and deconstructive readings of a software trace - Memory dump analysis compass - Computical and Stack Trace Art - The abductive reasoning of Philip Marlowe - Orbifold memory space and cloud computing - Memory worldview - Interpretation of cyberspace - Relationship of memory dumps to religion - Fully cross-referenced with Volume 1, Volume 2, Volume 3, Volume 4, and Volume 5

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