Knygos.lt nariams
151,89 €
-30%
Įprastai
216,99 €
Introduction to Focused Ion Beam Nanometrology
Knygos.lt nariams
151,89 €
-30%
Įprastai
216,99 €
- Išsiųsime per 12–18 d.d.
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
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- Autorius: David C Cox
- Leidėjas: MORGAN & CLAYPOOL
- Metai: 2015
- Puslapiai: 84
- ISBN-10: 1681740206
- ISBN-13: 9781681740201
- Formatas: 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Kalba: Anglų
Atsiliepimai
Aprašymas
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Knygos.lt nariams
151,89 €
-30%
Įprastai
216,99 €
Išsiųsime per 12–18 d.d.
- Autorius: David C Cox
- Leidėjas: MORGAN & CLAYPOOL
- Metai: 2015
- Puslapiai: 84
- ISBN-10: 1681740206
- ISBN-13: 9781681740201
- Formatas: 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Kalba: Anglų
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Atsiliepimai