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- Autorius: Klemens Jantscher
- Leidėjas: AV Akademikerverlag
- Metai: 2013
- Puslapiai: 104
- ISBN-10: 3639464346
- ISBN-13: 9783639464344
- Formatas: 15.2 x 22.9 x 0.6 cm, minkšti viršeliai
- Kalba: Anglų
Crystal structure determination in the scanning electron microscope (el. knyga) (skaityta knyga) | knygos.lt
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Aprašymas
Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of single crystallites - in a polycrystalline material - to each other or to a reference plane. In general this method is applied to analyze recrystallization processes, textures or grain size distributions in different materials. In this book both, basic experimental problems of the method and problems of the data analysis are studied. Additionally, the limitations of electron backscatter diffraction are fathomed analyzing different materials and questions. Using both mineral and metal particles, the influences of particle size and particle preparation on the quality of the measurements is investigated.
- Autorius: Klemens Jantscher
- Leidėjas: AV Akademikerverlag
- Metai: 2013
- Puslapiai: 104
- ISBN-10: 3639464346
- ISBN-13: 9783639464344
- Formatas: 15.2 x 22.9 x 0.6 cm, minkšti viršeliai
- Kalba: Anglų
Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of single crystallites - in a polycrystalline material - to each other or to a reference plane. In general this method is applied to analyze recrystallization processes, textures or grain size distributions in different materials. In this book both, basic experimental problems of the method and problems of the data analysis are studied. Additionally, the limitations of electron backscatter diffraction are fathomed analyzing different materials and questions. Using both mineral and metal particles, the influences of particle size and particle preparation on the quality of the measurements is investigated.
Atsiliepimai