Knygos.lt nariams
211,04 €
-30%
Įprastai
301,49 €
Advanced Laser Diode Reliability
Knygos.lt nariams
211,04 €
-30%
Įprastai
301,49 €
- Išsiųsime per 12–18 d.d.
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extract…
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- Autorius: Massimo Vanzi
- Leidėjas: ISTE Press - Elsevier
- Metai: 2021
- Puslapiai: 200
- ISBN-10: 1785481541
- ISBN-13: 9781785481543
- Formatas: 15.2 x 22.9 x 1.6 cm, kieti viršeliai
- Kalba: Anglų
Atsiliepimai
Aprašymas
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Knygos.lt nariams
211,04 €
-30%
Įprastai
301,49 €
Išsiųsime per 12–18 d.d.
- Autorius: Massimo Vanzi
- Leidėjas: ISTE Press - Elsevier
- Metai: 2021
- Puslapiai: 200
- ISBN-10: 1785481541
- ISBN-13: 9781785481543
- Formatas: 15.2 x 22.9 x 1.6 cm, kieti viršeliai
- Kalba: Anglų
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Atsiliepimai