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- Autorius: U S Department of Commerce
- Leidėjas: CreateSpace Independent Publishing Platform
- Metai: 2014
- Puslapiai: 54
- ISBN-10: 149474385X
- ISBN-13: 9781494743857
- Formatas: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Kalba: Anglų
A Next Generation Sampling Comparator Probe for the NIST Sampling Waveform Analyzer (el. knyga) (skaityta knyga) | knygos.lt
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Aprašymas
The design and performance of a Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against a previously designed ASIC probe. In addition to the design aspects of the probe, a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.
- Autorius: U S Department of Commerce
- Leidėjas: CreateSpace Independent Publishing Platform
- Metai: 2014
- Puslapiai: 54
- ISBN-10: 149474385X
- ISBN-13: 9781494743857
- Formatas: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Kalba: Anglų
The design and performance of a Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against a previously designed ASIC probe. In addition to the design aspects of the probe, a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.
Atsiliepimai