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Knygos.lt nariams
- Išsiųsime per 12–18 d.d.
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- Autorius: U S Department of Commerce
- Leidėjas: CreateSpace Independent Publishing Platform
- Metai: 2014
- Puslapiai: 52
- ISBN-10: 1494740974
- ISBN-13: 9781494740979
- Formatas: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Kalba: Anglų
A Four-Terminal Current Shunt with Calculable AC Response (el. knyga) (skaityta knyga) | knygos.lt
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Aprašymas
The design of a 0.1, four-terminal current shunt with calculable frequency dependence up to 1 MHz is described. It is intended for use as a standard for current measurements up to 10 A rms with the primary purpose of being able to tie alternating-current measurements to direct-current measurements. The shunt is of the bifilar flat-strip configuration where the effects of self-inductance, skin effect, capacitance, dissipation factor, and eddy-current losses are considered. Contributions of the individual effects, where applicable, are determined by calculation based on geometry and corroborated by differential measurements and finite-element field simulations. The uncertainties due to dimensional and electrical measurement tolerances are computed as well.
- Autorius: U S Department of Commerce
- Leidėjas: CreateSpace Independent Publishing Platform
- Metai: 2014
- Puslapiai: 52
- ISBN-10: 1494740974
- ISBN-13: 9781494740979
- Formatas: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Kalba: Anglų
The design of a 0.1, four-terminal current shunt with calculable frequency dependence up to 1 MHz is described. It is intended for use as a standard for current measurements up to 10 A rms with the primary purpose of being able to tie alternating-current measurements to direct-current measurements. The shunt is of the bifilar flat-strip configuration where the effects of self-inductance, skin effect, capacitance, dissipation factor, and eddy-current losses are considered. Contributions of the individual effects, where applicable, are determined by calculation based on geometry and corroborated by differential measurements and finite-element field simulations. The uncertainties due to dimensional and electrical measurement tolerances are computed as well.
Atsiliepimai